Quantitative measurement of radiation pressure on a microcantilever in ambient environment
|Author(s):||Dakang Ma, Joseph L. Garrett and Jeremy N. Munday|
|Citation(s):||Appl. Phys. Lett. 106, 091107 (2015)|
Manuscript: PDF |
Endnote: Endnote |
Abstract: Light reflected off a material or absorbed within it exerts radiation pressure through the transfer of momentum. Micro/nano-mechanical transducers have become sensitive enough that radiation pressure can influence these systems. However, photothermal effects often accompany and overwhelm the radiation pressure, complicating its measurement. In this letter, we investigate the radiation force on an uncoated silicon nitride microcantilever in ambient conditions. We identify and separate the radiation pressure and photothermal forces through an analysis of the cantilever's frequency response. Further, by working in a regime where radiation pressure is dominant, we are able to accurately measure the radiation pressure. Experimental results are compared to theory and found to agree within the measured and calculated uncertainties.